This document outlines the performance and mechanical requirements for the SHENZHEN JUSHUO ELECTRONICS CO., LTD product, including electrical and mechanical tests, and their corresponding test methods and standards.
| Item | Requirement | Test Method |
|---|---|---|
| Low level Contact resistance | 40 m (Max) initial for VBUS, GND and all other contacts. Maximum change (delta) of +10 m after environmental stresses. Measured at 20mV Max. open circuit at 100mA. Mated test contacts must be in a connector housing. | EIA-364-23B |
| Insulation Resistance | 100 M Min. | EIA 364-21 |
| Dielectric Strength | No breakdown shall occur when 100 Volts AC (RMS) is applied between adjacent contacts of unmated and mated connectors. | EIA-364-20 |
| Description | Current Rating | Pins |
|---|---|---|
| VBUS pins | 3.0 A | A4, A9, B4, and B9 |
| VCONN pin | 1.25 A | B35 (plug connector) with return path through GND pins (A1, A12, B1, and B12) |
| Other contacts | 0.25 A (minimum) | Individually |
| Condition | Requirement | Test Standard |
|---|---|---|
| When currents are applied to the contacts | Shall not exceed 30 C at any point on the USB Type-C mated plug and receptacle under test, when measured at an ambient temperature of 25 C. | EIA-364-70 method B |
| Item | Requirement | Test Method |
|---|---|---|
| Insertion Force | 0.5~2.0 kgf | EIA-364-13 |
| Extraction Force | 0.8~2.0 kgf | EIA-364-13 |
| Durability (Insertion/extraction Cycles) | 10,000 cycles | EIA-364-09 |
| Test Item | Max | Min | Avg | Specification | Judge |
|---|---|---|---|---|---|
| Insertion Force (kgf) | 10.25 | 8.97 | 9.51 | 0.5~2.0 | N OK |
| Extraction Force (kgf) | 15.17 | 14.57 | 14.89 | 0.8~2.0 | OK |
| Contact Resistance (m) | 13.92 | 9.17 | 11.57 | 40 | OK |
| Contact Resistance after Durability (m) | 17.30 | 8.71 | 12.99 | 8-20 | OK |
| Durability Cycles | 10000 | - | - | 10000 | OK |
| Insulation Resistance (M) | 9.54 | 8.67 | 9.14 | 100 | N OK |
